The temperature dependence of mismatch in deep-submicrometer bulk MOSFETs

IEEE Electron Device Letters

Volumn 30, Issue 6, 2009, Pages 690-692

  Andricciola, Pietro ^a   Tuinhout, Hans P ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

Author keywords

CMOS; Fluctuation sweep; Mismatch; Subthreshold region; Temperature effect

Indexed keywords

CMOS; FLUCTUATION SWEEP; MISMATCH; SUBTHRESHOLD REGION; TEMPERATURE EFFECT;

TEMPERATURE DISTRIBUTION;

THERMAL EFFECTS;

EID: 67649383237     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2009.2020524     Document Type: Article

References (11)

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