Parametric verification of one-way lithographic wicks

Lab on a Chip

Volumn 9, Issue 12, 2009, Pages 1667-1669

  Zhou, Jijie ^a   Huang, Xiao ^b  

^a SHANGHAI UNIVERSITY   (China)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBE; SILICON;

ARTICLE; GEOMETRY; LIQUID; MOTION; NANODEVICE; NANOTECHNOLOGY; NANOWICK; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY;

EID: 67649371516     PISSN: 14730197     EISSN: 14730189     Source Type: Journal    
DOI: 10.1039/b904552j     Document Type: Article

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