New measurement method to characterize piezoelectric SAW substrates at very high temperature

Proceedings - IEEE Ultrasonics Symposium

Volumn , Issue , 2008, Pages 1877-1880

  Nicolay, P ^a   Elmazria, O ^a,b   Sarry, F ^a   Aubert, T ^a   Bouvot, L ^a   Hehn, M ^a,b  

^a INSTITUT JEAN LAMOUR   (France)

^b Ecole Supèrieur et Sciences et Techniques   (France)

Author keywords

High temperature set up system; LGS; SAW; TCF

Indexed keywords

BONDING WIRES; CHARACTERIZATION METHODS; EXPERIMENTAL SETUP; HEATING RESISTANCE; HIGH TEMPERATURE; HIGH TEMPERATURE SET UP SYSTEM; LGS; LOW ENERGIES; MEASUREMENT APPARATUS; NEW MEASUREMENT METHOD; PIEZOELECTRIC SUBSTRATES; SAW DEVICE; SAW SENSORS; SMA CONNECTORS; TCF; TEMPERATURE CYCLES; TEST METHOD; VACUUM CHAMBERS; WHOLE SYSTEMS;

AGING OF MATERIALS; OXIDE MINERALS; PIEZOELECTRIC TRANSDUCERS; PIEZOELECTRICITY; PLATINUM; POLYCHLORINATED BIPHENYLS; QUARTZ; SUBSTRATES; ULTRASONIC TRANSDUCERS;

ACOUSTIC SURFACE WAVE DEVICES;

EID: 67649360319     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ULTSYM.2008.0462     Document Type: Conference Paper

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