|
|
Volumn 355, Issue 22-23, 2009, Pages 1274-1280
|
|
Structural characterization and phase transformation kinetics of Se58Ge42-xPbx (x = 9, 12) chalcogenide glasses
a
|
|
Author keywords
Amorphous semiconductors; Chalcogenides; Crystal growth; Crystallization; Crystals; Germanium; Glass ceramics; Glass formation; Glass transition; II VI semiconductors; Nucleation; Thermal properties; X ray diffraction
|
|
Indexed keywords
AVRAMI EXPONENT;
CHALCOGENIDE GLASS;
CUBIC STRUCTURE;
FREQUENCY FACTORS;
GLASS FORMATION;
GLASS TRANSITION BEHAVIOR;
GLASSY SYSTEMS;
II-VI SEMICONDUCTORS;
KINETIC STUDY;
MIXED PHASE;
MONOCLINIC STRUCTURES;
NON-ISOTHERMAL CONDITION;
ONE DIMENSION;
PHASE TRANSFORMATION KINETICS;
SINGLE GLASS TRANSITION;
STRUCTURAL CHARACTERIZATION;
THERMAL PROPERTIES;
THREE DIMENSIONS;
XRD PATTERNS;
ACTIVATION ENERGY;
AMORPHOUS SEMICONDUCTORS;
ANNEALING;
CHALCOGENIDES;
CRYSTAL GROWTH;
CRYSTALLIZATION KINETICS;
CRYSTALS;
DIFFERENTIAL SCANNING CALORIMETRY;
DIFFRACTION;
GERMANIUM;
GLASS TRANSITION;
GRAIN BOUNDARIES;
HEATING;
LEAD;
LEAD ALLOYS;
NUCLEATION;
PARAMETER ESTIMATION;
PHASE CHANGE MEMORY;
SELENIUM COMPOUNDS;
SEMICONDUCTING GERMANIUM;
SEMICONDUCTING SELENIUM COMPOUNDS;
SEMICONDUCTOR GROWTH;
THERMODYNAMIC PROPERTIES;
X RAY DIFFRACTION;
GLASS CERAMICS;
|
|
EID: 67649271538
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2009.04.032 Document Type: Article |
|
Times cited : (43)
|
|
References (21)
|
