Detecting inclusions in electrical impedance tomography without reference measurements

SIAM Journal on Applied Mathematics

Volumn 69, Issue 6, 2009, Pages 1662-1681

  Harrach, Bastian ^a   Seo, Jin Keun ^b  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

^b Yonsei University   (South Korea)

Author keywords

Complex conductivity; Electrical impedance tomography; Factorization method; Frequencydifference measurements; Inverse problems

Indexed keywords

COMPLEX CONDUCTIVITY; ELECTRICAL IMPEDANCE TOMOGRAPHY; FACTORIZATION METHOD; FACTORIZATION METHODS; FORWARD MODELING; FREQUENCYDIFFERENCE MEASUREMENTS;

DIAGNOSTIC RADIOGRAPHY; DIFFERENTIAL EQUATIONS; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC IMPEDANCE TOMOGRAPHY; FACTORIZATION; INCLUSIONS; INVERSE PROBLEMS;

ELECTRIC IMPEDANCE;

EID: 67649270861     PISSN: 00361399     EISSN: None     Source Type: Journal    
DOI: 10.1137/08072142X     Document Type: Article

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