Intermediate digital chip sensor for the EUDET-JRAI high resolution beam telescope

IEEE Nuclear Science Symposium Conference Record

Volumn , Issue , 2008, Pages 1351-1357

  Gelin, M ^a   Baudot, J ^b   Bertolone, G ^b   Besson, A ^b   Brogna, A ^b   Claus, G ^b   Colledani, C ^b   De Masi, R ^b   Degerli, Y ^a   Dorokhov, A ^b   Dulinski, W ^b   Goffe, M ^b   Guilloux, F ^a   Himmi, A ^b   Hu Guo, C ^b   Jaaskelainen, K ^b   Morel, F ^b   Orsini, F ^a   Specht, M ^b   Valin, I ^b   Winter, M ^b   more..

^a CEA SACLAY   (France)

^b IPHC   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE AREA; AMPLIFICATION GAIN; ANALOG TEST; BEAM TELESCOPES; CONTROL SIGNAL; DIGITAL CHIPS; DIGITAL PARTS; FAST READOUT; GEV ELECTRON BEAM; HIGH GRANULARITY; HIGH RESOLUTION; LABORATORY TEST; MONOLITHIC ACTIVE PIXELS SENSORS; PATTERN GENERATOR; PIXEL ARCHITECTURES; PIXEL ARRAYS; PIXEL PITCH; RADIATION TOLERANT; SPATIAL RESOLUTION; TEST BEAM;

AMPLIFICATION; DISCRIMINATORS; ELECTRON BEAMS; OPTICAL INSTRUMENTS; OPTICAL PROJECTORS; OPTICAL TELESCOPES; SENSORS; TELESCOPES;

PIXELS;

EID: 67649236961     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2008.4774667     Document Type: Conference Paper

References (8)

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8. C. Hu-Guo et al., "Design and characterisation of a fast architecture providing zero suppressed digital output integrated in a high resolution CMOS pixel sensor for the STAR vertex detector and the EUDET beam telescope", presented at Topical Workshop on Electronics for Particle Physics (1WEPP), Naxos, Greece, September 2008