Thermodynamic characterization of polymorphs in bulk-crystallized syndiotactic polystyrene via small/wide-angle X-ray scattering and differential scanning calorimetry

Macromolecules

Volumn 42, Issue 12, 2009, Pages 4200-4207

  Su, C H ^a,b   Jeng, U ^a   Chen, S H ^c   Cheng, C Y ^a   Lee, J J ^a   Lai, Y H ^a,d   Su, W C ^e   Tsai, J C ^f   Su, A C ^b,g  

^a NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^b NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^c NATIONAL DONG HWA UNIVERSITY   (Taiwan)

^d TUNGHAI UNIVERSITY   (Taiwan)

^e NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^f NATIONAL CHUNG CHENG UNIVERSITY   (Taiwan)

^g NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT PRESSURES; BASAL SURFACE; BULK CRYSTALLIZATION; CROSSOVER TEMPERATURE; CRYSTAL THICKNESS; CRYSTALLINE LAMELLA; CRYSTALLINITY; DATA ANALYSIS; ELEVATED TEMPERATURE; EQUILIBRIUM MELTING TEMPERATURE; GIBBS-THOMSON; HEAT OF FUSION; HEATING UP; HETEROGENEOUS NUCLEATION; HIGH TEMPERATURE; IN-SITU; LAMELLAR CRYSTALS; LAMELLAR THICKNESS; LOW CONCENTRATIONS; LOW TEMPERATURES; MELTING LINE; PARTIAL MELTING; PHASE PLANE; STABLE PHASE; SYNDIOTACTIC POLYSTYRENES; SYNDIOTACTIC POLYSTYRENES (SPS); THERMAL STABILITY; THERMODYNAMIC CHARACTERIZATION; TWO PHASIS;

CRYSTALS; EPITAXIAL GROWTH; MELTING; MELTING POINT; METALLIC GLASS; NUCLEATION; POLYMER BLENDS; POLYSTYRENES; SCANNING; SCATTERING; SURFACE CHEMISTRY; SURFACE TENSION; TEMPERATURE; THERMODYNAMIC STABILITY; X RAY SCATTERING;

DIFFERENTIAL SCANNING CALORIMETRY;

EID: 67649232436     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma900384b     Document Type: Article

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