Effect of uncertainties in the cross-sectional parameters on the wideband electrical properties of coplanar waveguides

Proceedings - 11th IEEE Workshop on Signal Propagation on Interconnects, SPI 2007

Volumn , Issue , 2007, Pages 35-38

  Leinhos, J ^a,b   Arz, U ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERISTIC IMPEDANCE; ELECTRICAL PROPERTY; MANUFACTURING TECHNOLOGIES; MATERIAL MEASUREMENTS; METALLIZATION THICKNESS; MICROWAVE SUBSTRATES; MONTE CARLO SIMULATIONS; PROPAGATION CONSTANT; QUASI-TEM; SUBSTRATE LOSS; WIDE-BAND;

ELECTRIC PROPERTIES; INTERCHANGES; SUBSTRATES; TECHNICAL PRESENTATIONS; UNCERTAINTY ANALYSIS;

COPLANAR WAVEGUIDES;

EID: 67649224052     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SPI.2007.4512202     Document Type: Conference Paper

References (8)

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8. U. Arz, J. Leinhos, D. Schubert, "Uncertainties in Coplanar Waveguide Capacitance Measurements," 10th IEEE Workshop on Signal Propagation on Interconnects, Proc. pp. 165-167, May 10-12, 2006. (Pubitemid 351752336)