Electric field stress simulation of plasma membrane under steep pulsed electric field

Gaodianya Jishu/High Voltage Engineering

Volumn 35, Issue 5, 2009, Pages 1088-1092

  Yao, Chen Guo ^a   Luo, Xiao ^a   Li, Cheng Xiang ^a   Mi, Yan ^a  

^a CHONGQING UNIVERSITY   (China)

Author keywords

Electric field stress; Irreversible electrical breakdown (IRE); Malignant tumor cell; Plasma membrane; Steep pulsed electric fields (SPEF); Transverse traction stresses

Indexed keywords

ELECTRIC FIELD STRESS; IRREVERSIBLE ELECTRICAL BREAKDOWN (IRE); MALIGNANT TUMOR CELL; PLASMA MEMBRANE; STEEP PULSED ELECTRIC FIELDS (SPEF); TRANSVERSE TRACTION STRESSES;

CELL MEMBRANES; CYTOLOGY; ELECTRIC BREAKDOWN OF LIQUIDS; ELECTRIC FIELD MEASUREMENT; ELECTRIC FIELDS; MEMBRANES; PLASMAS; TRACTION (FRICTION); TUMORS;

ELECTRIC TRACTION;

EID: 67649218546     PISSN: 10036520     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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