The influence of Calibration substrate boundary conditions on CPW characteristics and calibration accuracy at mm-Wave frequencies

2008 72nd ARFTG Microwave Measurement Symposium, ARFTG 2008

Volumn , Issue , 2008, Pages 168-173

  Rumiantsev, Andrej ^a   Doerner, Ralf ^b   Godshalk, Edward M ^c  

^a SUSS MicroTec Lithography GmbH   (United States)

^b LEIBNIZ INSTITUT FÜR HÖCHSTFREQUENZTECHNIK   (Germany)

^c MAXIM INTEGRATED PRODUCTS   (United States)

Author keywords

Calibration; Calibration comparison; Error correction; Scattering parameters measurement; Surface waves

Indexed keywords

CALIBRATION ACCURACY; CPW TRANSMISSION LINE; EXPERIMENTAL INVESTIGATIONS; MILLIMETER WAVELENGTH; MM-WAVE FREQUENCIES; SCATTERING PARAMETERS MEASUREMENT;

BANDPASS FILTERS; BOUNDARY CONDITIONS; ELECTRIC LINES; ERROR CORRECTION; FLUID DYNAMICS; IMAGE SENSORS; MILLIMETER WAVES; SCATTERING PARAMETERS; SURFACE WAVES; TRANSMISSION LINE THEORY; WATER WAVES;

CALIBRATION;

EID: 67649213373     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.2008.4804293     Document Type: Conference Paper

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