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Vibrational Spectroscopy

Volumn 51, Issue 1, 2009, Pages 76-79

Selection of modulation frequency of FT-IR equipped with an MCT detector for thin-film analysis

(3) Hasegawa, Takeshi a Taniguchi, Katsuhiko a Sato, Yoshiko b

a TOKYO INSTITUTE OF TECHNOLOGY (Japan)

b NIHON UNIVERSITY (Japan)

Author keywords

FT IR; MCT detector; Modulation frequency; Thin film

Indexed keywords

ABSORBANCE SPECTRUM; FT-IR; HIGH QUALITY; HIGH SIGNAL-TO-NOISE RATIO; HIGH-THROUGHPUT MEASUREMENTS; MCT DETECTOR; MEASUREMENT TIME; MODULATION FREQUENCIES; MODULATION FREQUENCY; PYRO-ELECTRIC DETECTORS; RELIABLE TRANSMISSION; SAMPLING FREQUENCIES; SCAN RATES; THIN FILM ANALYSIS; VERY THIN FILMS;

CADMIUM; DETECTORS; FADING (RADIO); LANGMUIR BLODGETT FILMS; MERCURY (METAL); MONOLAYERS; PYROELECTRICITY; SEMICONDUCTING CADMIUM COMPOUNDS; SIGNAL TO NOISE RATIO; THIN FILM DEVICES; THIN FILMS;

MODULATION;

EID: 67649209941 PISSN: 09242031 EISSN: None Source Type: Journal
DOI: 10.1016/j.vibspec.2008.10.018 Document Type: Article

Times cited : (3)

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