Sensitivity of photon-counting K-edge imaging: Dependence on atomic number and object size

IEEE Nuclear Science Symposium Conference Record

Volumn , Issue , 2008, Pages 4016-4021

  Roessl, Ewald ^a   Brendel, Bernhard ^a   Schlornka, Jens Peter ^a   Thran, Axel ^a   Proksa, Roland ^a  

^a PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

Photon counting; Spectral K edge imaging

Indexed keywords

ATOMIC NUMBERS; BEAM-HARDENING; CONTRAST MATERIAL; DETECTOR CALIBRATION; ENERGY RESOLUTIONS; ENERGY RESPONSE; ENERGY THRESHOLDS; GAUSSIAN; K-EDGE IMAGING; LOWER ENERGIES; OBJECT SIZE; OBJECT THICKNESS; PHOTO PEAKS; PHOTON-COUNTING; PHYSICAL EFFECTS; RESPONSE FUNCTIONS; SHIFT INVARIANT; SIGNAL LOSS; SPECTRAL K-EDGE IMAGING; SPECTRAL RESPONSE FUNCTIONS; X RAY SPECTRUM; X-RAY CT; X-RAY DETECTOR;

ACOUSTIC INTENSITY; ATOMIC SPECTROSCOPY; COMPUTERIZED TOMOGRAPHY; DETECTORS; MODELS; PHOTODEGRADATION; PHOTONS; SIGNAL TO NOISE RATIO;

ATOMS;

EID: 67649188840     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2008.4774164     Document Type: Conference Paper

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