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Volumn 20, Issue 21, 2009, Pages
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A crystallographic investigation of GaN nanostructures by reciprocal space mapping in a grazing incidence geometry
a
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Author keywords
[No Author keywords available]
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Indexed keywords
AREA DETECTORS;
CO-ORDINATE TRANSFORMATION;
CRYSTALLOGRAPHIC ORIENTATIONS;
EPITAXIALLY GROWN;
GAN NANOSTRUCTURES;
GRAZING INCIDENCE;
MULTIPODS;
RECIPROCAL SPACE MAPPING;
SAPPHIRE SUBSTRATES;
WURTZITE PHASE;
ZINC BLENDE;
CORUNDUM;
GALLIUM NITRIDE;
NANOSTRUCTURES;
SEMICONDUCTING GALLIUM;
ZINC;
ZINC SULFIDE;
GALLIUM ALLOYS;
GALLIUM;
GALLIUM NITRIDE;
NANOMATERIAL;
UNCLASSIFIED DRUG;
ARTICLE;
CHEMICAL ANALYSIS;
CRYSTALLOGRAPHY;
GEOMETRY;
NANOCHEMISTRY;
PRIORITY JOURNAL;
STRUCTURE ANALYSIS;
CHEMISTRY;
CONFORMATION;
CRYSTALLIZATION;
MACROMOLECULE;
MATERIALS TESTING;
METHODOLOGY;
NANOTECHNOLOGY;
PARTICLE SIZE;
REFRACTOMETRY;
SURFACE PROPERTY;
ULTRASTRUCTURE;
CRYSTALLIZATION;
CRYSTALLOGRAPHY;
GALLIUM;
MACROMOLECULAR SUBSTANCES;
MATERIALS TESTING;
MOLECULAR CONFORMATION;
NANOSTRUCTURES;
NANOTECHNOLOGY;
PARTICLE SIZE;
REFRACTOMETRY;
SURFACE PROPERTIES;
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EID: 67649165808
PISSN: 09574484
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/20/21/215703 Document Type: Article |
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Times cited : (7)
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References (9)
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