In-situ silicon integrated tuner for automated on-wafer MMW noise parameters extraction of Si HBT and MOSFET in the range 60-11OGHz

2008 72nd ARFTG Microwave Measurement Symposium, ARFTG 2008

Volumn , Issue , 2008, Pages 119-122

  Tagro, Y ^a,b   Gloria, D ^a   Boret, S ^a   Morandini, Y ^a   Dambrine, G ^b  

^a STMICROELECTRONICS   (France)

^b INSTITUT D ELECTRONIQUE   (France)

Author keywords

Active devices; Cold FET; DBT; Impedance tuner; In situ lab; MOSFET; Multi impedance; Noise microwave measurement; Transistors; Transmission lines; Varactor

Indexed keywords

ACTIVE DEVICES; COLD FET; DBT; IMPEDANCE TUNER; IN-SITU LAB; MOSFET; MULTI-IMPEDANCE; NOISE MICROWAVE MEASUREMENT; TRANSMISSION LINES;

ELECTRIC LINES; FIELD EFFECT TRANSISTORS; MESFET DEVICES; MICROWAVE MEASUREMENT; MICROWAVES; MOSFET DEVICES; SILICON WAFERS; TRANSMISSION LINE THEORY; TUNERS; VARACTORS;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 67649158540     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.2008.4804284     Document Type: Conference Paper

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