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Volumn , Issue , 2005, Pages 3627-3630

A compact distance cell for analog classifiers

Author keywords

[No Author keywords available]

Indexed keywords

AREA DENSITY; AREA EFFICIENCY; CMOS INVERTERS; CMOS PROCESS; CURRENT TRANSFER; DYNAMIC TEMPLATES; MOS TRANSISTORS; SILICON AREA; SINGLE-ENDED; TWO-DIMENSIONAL ARRAYS;

EID: 67649112366     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2005.1465415     Document Type: Conference Paper
Times cited : (2)

References (9)
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    • (1992) IEEE Trans. Neural Networks , vol.3 , pp. 506-518
    • Fang, W.-C.1    Sheu, B.J.2    Chen, O.T.-C.3    Choi, J.4
  • 3
    • 0027594584 scopus 로고
    • A charge-based on-chip adaptation kohonen network
    • Y. He and U. Çilingiroglu, "A charge-based on-chip adaptation kohonen network," IEEE Trans. Neural Networks, vol.4, pp.462-469, 1993.
    • (1993) IEEE Trans. Neural Networks , vol.4 , pp. 462-469
    • He, Y.1    Çilingiroglu, U.2
  • 5
    • 0031618175 scopus 로고    scopus 로고
    • A 4-transistor Euclidean Distance Cell For Analog Classifiers
    • 98, Monterey
    • U. Çilingiroglu, D.Y. Aksin, "A 4-transistor Euclidean Distance Cell For Analog Classifiers," Proceedings of ISCAS'98, Monterey 1998.
    • (1998) Proceedings of ISCAS
    • Çilingiroglu, U.1    Aksin, D.Y.2
  • 6
    • 0006193491 scopus 로고    scopus 로고
    • A Programmable CMOS Analog Vector Quantizer Chip,
    • M.Sc. Thesis, Istanbul Technical University, July
    • D. Y. Aksin, "A Programmable CMOS Analog Vector Quantizer Chip," M.Sc. Thesis, Istanbul Technical University, July 1999.
    • (1999)
    • Aksin, D.Y.1
  • 7
    • 0022891057 scopus 로고
    • Characterization and Modeling of Mismatch in MOS Transistors for Precision Analog Design
    • December
    • Lakshmikumar, Hadaway, Copeland, "Characterization and Modeling of Mismatch in MOS Transistors for Precision Analog Design," IEEE Journal of Solid-State Circuits vol sc-21 No 6, pp 1057-1066, December 1986.
    • (1986) IEEE Journal of Solid-State Circuits vol sc-21 , vol.6 , pp. 1057-1066
    • Lakshmikumar1    Hadaway2    Copeland3
  • 8
    • 0024754187 scopus 로고
    • Matching Properties of MOS Transistors
    • October
    • Pelgrom, Duinmaijer, Welbers, "Matching Properties of MOS Transistors," IEEE Journal of Solid-State Circuits vol 24 No 5, pp 1433-1439, October 1989.
    • (1989) IEEE Journal of Solid-State Circuits , vol.24 , Issue.5 , pp. 1433-1439
    • Pelgrom1    Duinmaijer2    Welbers3
  • 9
    • 0031700520 scopus 로고    scopus 로고
    • Optimizing MOS Transistor Mismatch
    • January
    • Lovett, Welten, Mathewson, Mason, "Optimizing MOS Transistor Mismatch," IEEE Journal of Solid-State Circuits vol 33 No 1, pp 147-150, January 1998.
    • (1998) IEEE Journal of Solid-State Circuits , vol.33 , Issue.1 , pp. 147-150
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.