Robust 2D ear registration and recognition based on SIFT point matching

BTAS 2008 - IEEE 2nd International Conference on Biometrics: Theory, Applications and Systems

Volumn , Issue , 2008, Pages

  Bustard, John D ^a   Nixon, Mark S ^a  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BACKGROUND CLUTTER; CONTROLLED CONDITIONS; DATA SETS; DISTANCE ALGORITHM; EAR RECOGNITION; FEATURE MATCH; HOMOGRAPHY; PLANAR SURFACE; POINT-MATCHING; POSE VARIATION; RECENT PROGRESS; RECOGNITION RATES; SIFT FEATURE; VIEWING ANGLE;

BIOMETRICS; CLUTTER (INFORMATION THEORY); FACE RECOGNITION;

TWO DIMENSIONAL;

EID: 67549134812     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/BTAS.2008.4699373     Document Type: Conference Paper

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