The iris challenge evaluation 2005

BTAS 2008 - IEEE 2nd International Conference on Biometrics: Theory, Applications and Systems

Volumn , Issue , 2008, Pages

  Phillips, P Jonathon ^a   Bowyer, Kevin W ^b   Flynn, Patrick J ^b   Liu, Xiaomei ^b   Scruggs, W Todd ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF NOTRE DAME   (United States)

^c SCIENCE APPLICATIONS INTERNATIONAL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA SETS; FALSE ACCEPT RATE; IRIS IMAGES; IRIS RECOGNITION; MATCH SCORE; QUALITY MEASURES; RIGHT AND LEFT;

BIOMETRICS;

ICE;

EID: 67549085131     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/BTAS.2008.4699333     Document Type: Conference Paper

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