Characterization of copper SERS-active substrates prepared by electrochemical deposition

Applied Surface Science

Volumn 255, Issue 18, 2009, Pages 7864-7870

  Cejkova, Jitka ^a   Prokopec, Vadym ^a   Brazdova, Sona ^a   Kokaislova, Alzbeta ^a   Matejka, Pavel ^a   Stepanek, Frantisek ^a  

^a INSTITUTE OF CHEMICAL TECHNOLOGY   (Czech Republic)

Author keywords

Atomic Force Microscopy (AFM); Copper; Electrochemical deposition; Scanning Electron Microscopy (SEM); Surface Enhanced Raman Scattering (SERS)

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPPER; ELECTROCHEMICAL DEPOSITION; RAMAN SCATTERING; RAMAN SPECTROSCOPY; REDUCTION; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; SURFACE SCATTERING;

AVERAGE SURFACE ROUGHNESS; MICROSCOPIC MEASUREMENT; SERS-ACTIVE SUBSTRATES; SPECTRAL INTENSITY; SUBSTRATE PREPARATION; SURFACE ENHANCED RAMAN SCATTERING (SERS); SURFACE ENHANCEMENT; SURFACE NANOSTRUCTURE;

SUBSTRATES;

EID: 67549084345     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.04.152     Document Type: Article

References (19)

1. Nie S., and Emory S.R. Science 275 (1997) 1102
2. Smith E., and Dent G. Modern Raman Spectroscopy: A Practical Approach (2005), John Wiley & Sons, Chichester, United Kingdom
3. Otto A. Journal of Raman Spectroscopy (2005) 497
4. Kudelski A., and Bukowska J. Vibrational Spectroscopy 10 (1996) 335
5. Van Duyne R.P., Hulteen J.C., and Treichel D.A. Journal of Chemical Physics 99 (1993) 2101
6. Bozzini B., D'Urzo L., Re M., and De Riccardis F. Journal of Applied Electrochemistry 38 (2008) 1561
7. Blatchford C.G., Campbell J.R., and Creighton J.A. Surface Science 120 (1982) 435
8. Hatab N.A.A., Oran J.M., and Sepaniak M.J. ACS Nano 2 (2008) 377
9. Persson B.N.J., Ke Z., and Zhenyu Z. Physical Review Letters 96 (2006) 207401
10. Shin K.S., Ryoo H., Lee Y.M., and Kin K. Bulletin of the Korean Society 29 (2008) 445
11. Zou S., Weaver M.J., Li X.Q., Ren B., and Tian Z.Q. Journal of Physical Chemistry B 103 (1999) 4218
12. Huang Q.j., Yao J.L., Mao B.W., Gu R.A., and Tian Z.Q. Chemical Physics Letters 271 (1997) 101
13. Ren B., Liu G.K., Lian X.B., Yang Z.L., and Tian Z.Q. Analytical and Bioanalytical Chemistry 388 (2007) 29
14. Binnig G., Quate C.F., and Gerber C. Physical Review Letters 56 (1986) 930
15. Prokopec V., Cejkova J., Matejka P., and Hasal P. Surface and Interface Analysis 40 (2008) 601
16. Clupek M., Prokopec V., Matejka P., and Volka K. Journal of Raman Spectroscopy 39 (2008) 515
17. Shin K.S., Lee H.S., Joo S.W., and Kim K. Journal of Physical Chemistry C 111 (2007) 15223
18. Kim K., and Lee H.S. Journal of Physical Chemistry B 109 (2005) 18929
19. Bozzini B., D'Urzo L., Mele C., and Romanello V. Journal of Materials Science-Materials in Electronics 17 (2006) 915