Bivariate sign tests based on the SUP, L1 and L2 norms

Annals of the Institute of Statistical Mathematics

Volumn 52, Issue 3, 2000, Pages 488-506

  Larocque, Denis ^a,c   Tardif, Serge ^a   Van Eeden, Constance ^b  

^a UNIVERSITÉ DE MONTRÉAL   (Canada)

^b UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^c UNIVERSITÉ DU QUÉBEC À TROIS RIVIÈRES   (Canada)

Author keywords

Affine invariance; Blumen's test; Distribution free; Hodges' test; L1 norm; L2 norm; Location problem; Normal process; Wiener process

Indexed keywords

EID: 6744262252     PISSN: 00203157     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1004121503274     Document Type: Article

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