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Volumn 52, Issue 2, 2000, Pages 367-379

Influence analysis for linear measurement error models

Author keywords

Corrected likelihood; Diagnostics; Global influence; Local influence; Measurement error models

Indexed keywords


EID: 6744243279     PISSN: 00203157     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1004126108349     Document Type: Article
Times cited : (24)

References (28)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.