Defect study on polyaniline by positron annihilation spectrometry

Applied Radiation and Isotopes

Volumn 67, Issue 7-8, 2009, Pages 1454-1457

  Nam, Ki Yong ^a   Jeon, Sang June ^a   Beack, Seung Hwa ^a   Joo, Koan Sik ^a  

^a Myong Ji University   (South Korea)

Author keywords

Defect measurement; Fast coincidence system; Positron annihilation lifetime spectroscopy; Scintillator detector

Indexed keywords

BULK LIFETIME; DEFECT STUDY; DELAY LINE; FAST COINCIDENCE SYSTEM; LENGTH DEPENDENCE; MONOENERGETIC; POSITRON ACCELERATION; POSITRON ANNIHILATION LIFETIME SPECTROSCOPY; POSITRON LIFETIME; SCINTILLATOR DETECTOR; TIME RESOLUTION;

DEFECTS; ELECTRIC CONDUCTIVITY; ELECTRONS; LUMINESCENCE; PARTICLE DETECTORS; POLYANILINE; POSITRON ANNIHILATION; SCINTILLATION; SCINTILLATION COUNTERS; SPECTROMETERS; SPECTROMETRY;

POSITRON ANNIHILATION SPECTROSCOPY;

POLYANILINE; PROTON;

ARTICLE; CONTROLLED STUDY; ELECTRIC CONDUCTIVITY; POSITRON; PRIORITY JOURNAL; PROTON TRANSPORT; SCINTILLATION; SPECTROMETRY;

EID: 67349286179     PISSN: 09698043     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apradiso.2009.02.075     Document Type: Article

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