XPS analysis of sonochemically prepared SbSI ethanogel

Applied Surface Science

Volumn 255, Issue 17, 2009, Pages 7689-7694

  Nowak, M ^a   Talik, E ^b   Szperlich, P ^a   Stroz D ^b  

^a SILESIAN UNIVERSITY OF TECHNOLOGY   (Poland)

^b UNIVERSITY OF SILESIA   (Poland)

Author keywords

Antimony sulfoiodide; Nanowires; Semiconductors; Sonochemistry; X ray photoelectron spectroscopy

Indexed keywords

BINDING ENERGY; NANOWIRES; PHOTOELECTRONS; PHOTONS; SEMICONDUCTOR MATERIALS; SINGLE CRYSTALS; SONOCHEMISTRY; X RAY PHOTOELECTRON SPECTROSCOPY;

ANTIMONY SULFOIODIDE; ENERGY RANGES; K-ALPHA RADIATION; P TYPE SEMICONDUCTOR; S STATE; XPS ANALYSIS; XPS SPECTRA;

SEMICONDUCTING ANTIMONY COMPOUNDS;

EID: 67349285803     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.04.138     Document Type: Article

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