Infrared emission imaging as a tool for characterization of hydrogen storage materials

Journal of Alloys and Compounds

Volumn 477, Issue 1-2, 2009, Pages 8-15

  Oguchi, H ^c   Heilweil, E J ^b   Josell, D ^a   Bendersky, L A ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c UNIVERSITY OF MARYLAND   (United States)

Author keywords

Combinatorial; Films; Hydrogen storage; IR emissivity; Mg Ni

Indexed keywords

ANNEALED FILMS; BULK ALLOYS; COMBINATORIAL; COMBINATORIAL SCREENINGS; COMBINATORIAL THIN FILMS; COMPOSITION GRADIENTS; COMPOSITION SPREADS; ELECTRON-BEAM DEPOSITIONS; FCC PHASE; HYDRIDE PHASIS; HYDROGEN ABSORPTIONS; HYDROGEN GAS; HYDROGEN STORAGE MATERIALS; IN-SITU HYDROGENATIONS; INFRA-RED CAMERAS; INFRA-RED EMISSIONS; INFRARED INTENSITIES; IR EMISSIVITY; METAL HYDRIDE STORAGES; METASTABLE PHASE; MG-NI; MULTI LAYERS; NANO-SCALE; TEM; VARYING THICKNESS; X-RAY AMORPHOUS; X-RAY DIFFRACTIONS;

CHEMICAL ANALYSIS; CHEMICAL MODIFICATION; DESORPTION; ELECTRODEPOSITION; ELECTROMAGNETIC WAVE EMISSION; FILM PREPARATION; GAS ABSORPTION; HYDROGEN; HYDROGEN STORAGE; HYDROGENATION; LITHIUM COMPOUNDS; MATERIALS PROPERTIES; METASTABLE PHASES; MICROSTRUCTURE; MULTILAYER FILMS; NICKEL; PALLADIUM; RESISTORS; TRANSMISSION ELECTRON MICROSCOPY;

AMORPHOUS FILMS;

EID: 67349273827     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.10.053     Document Type: Article

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