X-ray absorption spectroscopic analysis of CuIr2S4

Journal of Alloys and Compounds

Volumn 480, Issue 1, 2009, Pages 120-122

  Kijima, N ^a   Yashiro, H ^b   Awaka, J ^a   Akimoto, J ^a   Nagata, S ^c  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b RIGAKU CORPORATION   (Japan)

^c MURORAN INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Electronic properties; Solid state reactions; Transition metal alloys and compounds; X ray absorption fine structure

Indexed keywords

CU K-EDGE; SPINEL-TYPE OXIDE; STRUCTURE TRANSFORMATIONS; TEMPERATURE RANGE; TEMPERATURE-INDUCED; TRANSITION METAL ALLOYS AND COMPOUNDS; X RAY ABSORPTION FINE STRUCTURES; X-RAY ABSORPTION FINE STRUCTURE; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; X-RAY ABSORPTION SPECTRUM; XAFS; XANES SPECTRA;

ABSORPTION; ABSORPTION SPECTROSCOPY; COPPER ALLOYS; ELECTRONIC PROPERTIES; IRIDIUM; METAL INSULATOR BOUNDARIES; METAL INSULATOR TRANSITION; SEMICONDUCTOR INSULATOR BOUNDARIES; SOLID STATE REACTIONS; SPECTROSCOPIC ANALYSIS; TRANSITION METALS; X RAY ABSORPTION; X RAY ANALYSIS; X RAYS;

X RAY APPARATUS;

EID: 67349258968     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.09.199     Document Type: Article

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