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Volumn 46, Issue 1-2, 2009, Pages 166-170
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Interference effects in the excitation of collective electronic modes in nanoscale thin Ag films
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Author keywords
Electron energy loss spectroscopy (EELS); Silver; Surface plasmons
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Indexed keywords
DIFFRACTION EFFECTS;
ELECTRON ENERGY LOSS SPECTROSCOPY (EELS);
ELECTRONIC MODE;
IMPINGING ELECTRONS;
INTERFERENCE EFFECTS;
INTERFERENCE PHENOMENA;
JELLIUM;
NANO SCALE;
SCATTERING ANGLES;
SCATTERING PLANE;
SURFACE PLASMONS;
THIN AG FILMS;
DISSOCIATION;
ELECTRON BEAM LITHOGRAPHY;
ELECTRON BEAMS;
ELECTRON EMISSION;
ELECTRON SCATTERING;
ENERGY DISSIPATION;
NANOSTRUCTURED MATERIALS;
NUCLEAR INSTRUMENTATION;
OPTICAL DATA STORAGE;
PLASMONS;
SILVER;
ELECTRON ENERGY LOSS SPECTROSCOPY;
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EID: 67349250136
PISSN: 07496036
EISSN: 10963677
Source Type: Journal
DOI: 10.1016/j.spmi.2008.10.003 Document Type: Article |
Times cited : (11)
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References (23)
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