Valence-EELS analysis of local electronic and optical properties of PMN-PT epitaxial film

Materials Science and Engineering: B

Volumn 161, Issue 1-3, 2009, Pages 160-165

  Kiguchi, Takanori ^a   Wakiya, Naoki ^b   Shinozaki, Kazuo ^c   Konno, Toyohiko J ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b SHIZUOKA UNIVERSITY   (Japan)

^c TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

EELS; Electronic structure; Optical properties; PMN PT; Transmission electron microscopy; Valence electrons

Indexed keywords

DENSITY FUNCTIONAL THEORY; ENERGY GAP; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LEAD TITANATE; LIGHT ABSORPTION; MAGNESIUM COMPOUNDS; NIOBIUM COMPOUNDS; OPTICAL DATA PROCESSING; PLASMONS; REFRACTIVE INDEX; SILICON WAFERS; THIN FILMS; TITANIUM COMPOUNDS;

ELECTRICAL AND OPTICAL PROPERTIES; ELECTRONIC AND OPTICAL PROPERTIES; ELECTRONIC.STRUCTURE; INTER-BAND TRANSITION; PLASMON PEAKS; PMN-PT; PMN-PT FILM; SI(0 0 1); VALENCE EELS; VALENCE ELECTRON;

ELECTRONIC STRUCTURE;

EID: 67349247356     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2009.01.015     Document Type: Article

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