Atomistic simulation on size-dependent yield strength and defects evolution of metal nanowires

Computational Materials Science

Volumn 46, Issue 1, 2009, Pages 142-150

  Yang, Zhenyu ^a   Lu, Zixing ^a   Zhao, Ya Pu ^b  

^a BEIHANG UNIVERSITY   (China)

^b INSTITUTE OF MECHANICS   (China)

Author keywords

Modified embedded atom method (MEAM); Molecular dynamics (MD); Nanowires; Size dependent; Yield strength

Indexed keywords

ATOMISTIC SIMULATIONS; CROSS SECTIONAL AREA; CRYSTALLOGRAPHIC ORIENTATIONS; DEFECTS EVOLUTION; MECHANICAL BEHAVIOR; METAL NANOWIRE; MODIFIED EMBEDDED ATOM METHOD (MEAM); MODIFIED EMBEDDED ATOM METHODS; MOLECULAR DYNAMICS SIMULATIONS; NANO-MATERIALS; PLASTIC PROPERTY; SINGLE-CRYSTALLINE; SIZE-DEPENDENT; SURFACE STRESS; TENSILE LOADING; THEORETICAL PREDICTION; ULTRA-SMALL; YIELD STRENGTH;

ATOMS; CARBON NANOTUBES; CONTINUUM MECHANICS; ELASTICITY; ELECTRIC WIRE; MECHANICAL PROPERTIES; MOLECULAR DYNAMICS; NANOWIRES; STACKING FAULTS; STRESSES; STRETCHING; VIBRATIONS (MECHANICAL);

YIELD STRESS;

EID: 67349226092     PISSN: 09270256     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.commatsci.2009.02.015     Document Type: Article

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