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Volumn 86, Issue 4-6, 2009, Pages 783-786

Consequences of non-standard bleaching on microlithographic performance

Author keywords

Optical bleaching; Photolithography; Process latitude; Resist

Indexed keywords

BIOMEDICAL MICRODEVICES; ECONOMIC CONSIDERATIONS; HIGH RESOLUTIONS; LITHOGRAPHIC PROCESS; OPTICAL BLEACHING; PHOTOLITHOGRAPHY SIMULATIONS; PROCESS LATITUDE; RESIST; RESIST PROFILES; ROAD MAPS;

EID: 67349217753     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2008.11.101     Document Type: Article
Times cited : (2)

References (8)
  • 1
    • 67349179917 scopus 로고    scopus 로고
    • B.J. Lin, Microelectronic Engineering 86, this issue.
    • B.J. Lin, Microelectronic Engineering 86, this issue.
  • 2
    • 67349236362 scopus 로고    scopus 로고
    • C.G. Wilson, Microelectronic Engineering 86, this issue.
    • C.G. Wilson, Microelectronic Engineering 86, this issue.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.