Microstructural characterization of the V-doped nano-titania

Journal of Alloys and Compounds

Volumn 482, Issue 1-2, 2009, Pages 256-260

  Bhattacharyya, K ^a   Patra, A K ^a   Sastry, P U ^a   Tyagi, A K ^a  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

Oxide materials; SAXS; Sol gel process; TEM; XRD

Indexed keywords

ANATASE STRUCTURES; AVERAGE PARTICLE SIZE; DOPED TITANIA; LIMITING VALUES; MICRO-STRUCTURAL CHARACTERIZATION; MODIFIED SOL-GEL METHOD; NANO-TITANIA; OXIDE MATERIALS; RAMAN SPECTRA; SAXS; SMALL ANGLE X-RAY SCATTERING; SPHERICAL PARTICLE; TEM; TIO; XRD; XRD-PEAK BROADENING;

DOPING (ADDITIVES); GELATION; GELS; NANOSTRUCTURED MATERIALS; PARTICLE SIZE; SOL-GELS; SOLS; TITANIUM DIOXIDE; TITANIUM OXIDES; VANADIUM; VANADIUM ALLOYS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

SOL-GEL PROCESS;

EID: 67349217718     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.03.171     Document Type: Article

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