Pressure and compositional dependence of electric conductivity in the (Mg1 - xFex)1 - δO (x = 0.01-0.40) solid-solution

Solid State Ionics

Volumn 180, Issue 6-8, 2009, Pages 501-505

  Yoshiasa, Akira ^a   Ohtaka, Osamu ^b   Sakamoto, Daisuke ^b   Andrault, Denis ^c   Fukui, Hiroshi ^d   Okube, Maki ^e  

^a KUMAMOTO UNIVERSITY   (Japan)

^b OSAKA UNIVERSITY   (Japan)

^c UNIVERSITÉ BLAISE PASCAL   (France)

^d RIKEN HARIMA INSTITUTE   (Japan)

^e TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

(Mg1 xFex)1 O; Conduction mechanism in lower mantle; High pressure; Ionic conduction; Small polaron

Indexed keywords

CHARGE TRANSPORT MECHANISMS; CHEMICAL COMPOSITIONS; COMPLEX IMPEDANCE METHODS; COMPOSITIONAL DEPENDENCES; CONDUCTION MECHANISM IN LOWER MANTLE; ELECTRICAL CONDUCTION MECHANISMS; ELECTRICAL CONDUCTIVITY MEASUREMENTS; EXTRINSIC FACTORS; FERROPERICLASE; GROWTH METHODS; HIGH PRESSURE; HIGH TEMPERATURES; HIGHER TEMPERATURES; INFLECTION POINTS; LOW TEMPERATURES; LOWER MANTLE CONDITIONS; SMALL POLARON; SOLID-SOLUTION;

ACTIVATION ENERGY; ARRHENIUS PLOTS; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTRIC CONDUCTIVITY MEASUREMENT; ENGINEERING EXHIBITIONS; IONIC CONDUCTION; POLARONS; SINGLE CRYSTALS; SOLID SOLUTIONS; SOLIDIFICATION;

PRESSURE EFFECTS;

EID: 67349204780     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2008.10.012     Document Type: Article

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