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Volumn 390-391, Issue 1, 2009, Pages 568-571

Ion implanted deuterium retention and release from clean and oxidized beryllium

Author keywords

[No Author keywords available]

Indexed keywords

BINDING STATE; DEUTERIUM RETENTIONS; ION IMPLANTED; ION-INDUCED DEFECTS; RATE-LIMITING; RELEASE PROCESS; RETENTION MECHANISMS; SURFACE LAYERS; TARGET TEMPERATURES; THERMAL RECYCLING; THERMAL RELEASE; X-RAY PHOTOELECTRON SPECTROSCOPIES;

EID: 67349202185     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2009.01.103     Document Type: Article
Times cited : (21)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.