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Volumn 390-391, Issue 1, 2009, Pages 568-571
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Ion implanted deuterium retention and release from clean and oxidized beryllium
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Author keywords
[No Author keywords available]
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Indexed keywords
BINDING STATE;
DEUTERIUM RETENTIONS;
ION IMPLANTED;
ION-INDUCED DEFECTS;
RATE-LIMITING;
RELEASE PROCESS;
RETENTION MECHANISMS;
SURFACE LAYERS;
TARGET TEMPERATURES;
THERMAL RECYCLING;
THERMAL RELEASE;
X-RAY PHOTOELECTRON SPECTROSCOPIES;
ACTIVATION ENERGY;
BERYLLIUM;
DEUTERIUM;
DEUTERIUM COMPOUNDS;
TEMPERATURE PROGRAMMED DESORPTION;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 67349202185
PISSN: 00223115
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnucmat.2009.01.103 Document Type: Article |
Times cited : (21)
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References (15)
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