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Volumn 31, Issue 5, 2009, Pages 201-205

A generalized method to improve the location accuracy of the single-ended sampled data and lumped parameter model based fault locators

Author keywords

ATP simulation tests; Distributed parameter; Lumped parameter; Single ended fault location

Indexed keywords

ATP SIMULATION TESTS; BERGERON MODELS; DISTRIBUTED CAPACITANCES; DISTRIBUTED PARAMETER; FAULT LOCATION ALGORITHMS; FAULT LOCATORS; GENERALIZED ALGORITHMS; GENERALIZED METHODS; IMPROVED ALGORITHMS; LOCATION ACCURACIES; LUMPED PARAMETER; LUMPED PARAMETER MODELS; MEASURED IMPEDANCES; PROTECTION DEVICES; SAMPLED DATUM; SAMPLING RATES; SINGLE-ENDED FAULT LOCATION; TRANSMISSION LINES;

EID: 67349196490     PISSN: 01420615     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijepes.2009.01.003     Document Type: Article
Times cited : (21)

References (9)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.