Cycling degradation in TANOS stack

Microelectronic Engineering

Volumn 86, Issue 7-9, 2009, Pages 1822-1825

  Ghidini, G ^a   Scozzari, C ^a   Galbiati, N ^a   Modelli, A ^a   Camerlenghi, E ^a   Alessandri, M ^a   Del Vitto, A ^a   Albini, G ^a   Grossi, A ^a   Ghilardi, T ^a   Tessariol, P ^a  

^a Numonyx   (Italy)

Author keywords

Cycling; Dielectrics; Reliability; TANOS

Indexed keywords

BIPOLAR STRESS; CYCLING; DEGRADATION MECHANISM; DIELECTRICS; FLOATING GATES; KEY FACTORS; PHYSICAL MECHANISM; STACK CONFIGURATIONS; TANOS;

DEGRADATION;

EID: 67349188849     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2009.03.041     Document Type: Article

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