Dispersion and damping of surface plasmon in Ag thin films grown on Cu(111) and Ni(111)

Superlattices and Microstructures

Volumn 46, Issue 1-2, 2009, Pages 137-140

  Politano, A ^a   Formoso, V ^a,b   Chiarello, G ^a,c  

^a UNIVERSITY OF CALABRIA   (Italy)

^b INFM   (Italy)

^c CNISM Consorzio Nazionale Interuniversitario per le Scienze Fisiche della Materia ^*  (Italy)

Author keywords

Electron energy loss spectroscopy (EELS); Silver; Surface plasmons

Indexed keywords

AG FILMS; CU(1 1 1); ELECTRON ENERGY LOSS SPECTROSCOPY (EELS); ELECTRONIC EXCITATION; ENERGY-LOSS SPECTROSCOPY; HIGH RESOLUTION; LAYER-BY-LAYER; QUADRATIC DISPERSION; SURFACE PLASMONS; ULTRA-THIN;

COPPER; DAMPING; DISSOCIATION; ELECTRON EMISSION; ELECTRON SCATTERING; ENERGY DISSIPATION; NICKEL; NUCLEAR INSTRUMENTATION; OPTICAL DATA STORAGE; PLASMONS; SILVER; ULTRATHIN FILMS;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 67349180649     PISSN: 07496036     EISSN: 10963677     Source Type: Journal    
DOI: 10.1016/j.spmi.2008.10.017     Document Type: Article

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