Goodness-of-fit tests for parametric regression with selection biased data

Journal of Statistical Planning and Inference

Volumn 139, Issue 8, 2009, Pages 2836-2850

  Ojeda Cabrera, Jorge L ^a   Van Keilegom, Ingrid ^b  

^a UNIVERSITY OF ZARAGOZA   (Spain)

^b UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

Biased sampling; Bootstrap; Empirical process; Goodness of fit test; Heteroscedastic model; Location scale regression; Model diagnostics; Nonparametric regression; Weak convergence

Indexed keywords

EID: 67349178616     PISSN: 03783758     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jspi.2009.01.008     Document Type: Article

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