Structural properties of Pb3 Mn7 O15 determined from high-resolution synchrotron powder diffraction

Journal of Solid State Chemistry

Volumn 182, Issue 5, 2009, Pages 1188-1192

  Rasch, Julia C E ^a,b   Sheptyakov, D V ^b   Schefer, J ^b   Keller, L ^b   Boehm, M ^a   Gozzo, F ^c   Volkov, N V ^d   Sablina, K A ^d   Petrakovskii, G A ^d   Grimmer, H ^c   Conder, K ^c   Loffler J F ^e  

^a INSTITUT LAUE LANGEVIN   (France)

^b Laboratory for Neutron Scattering Villigen   (Switzerland)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

^d KIRENSKY INSTITUTE OF PHYSICS   (Russian Federation)

^e ETH ZURICH   (Switzerland)

Author keywords

Layered compounds; Manganites; Powder X ray diffraction

Indexed keywords

BULK MEASUREMENTS; CHEMICAL STRUCTURES; CRYSTALLOGRAPHIC STRUCTURES; HIGH RESOLUTIONS; LAYERED COMPOUNDS; ORTHORHOMBIC SPACE GROUPS; POWDER X-RAY DIFFRACTION; ROOM TEMPERATURES; SYNCHROTRON POWDER DIFFRACTIONS; UNIT CELLS; X-RAY DATUM;

DIFFRACTION; LEAD; LEAD ALLOYS; LEAD COMPOUNDS; MANGANESE; MANGANESE COMPOUNDS; OXIDE MINERALS; POWDERS; SINGLE CRYSTALS; SYNCHROTRONS; X RAY DIFFRACTION;

CRYSTAL STRUCTURE;

EID: 67349166502     PISSN: 00224596     EISSN: 1095726X     Source Type: Journal    
DOI: 10.1016/j.jssc.2009.02.001     Document Type: Article

References (15)

1. Volkov N.V., Sablina K.A., Bayukov O.A., Eremin E.V., Petrakovskii G.A., Velikanov D.A., Balaev A.D., Bovina A.F., Boni P., and Clementyev E. J. Phys. Condens. Matter 20 (2008) 055217
2. Searle C.W., and Wang S.T. Can. J. Phys. 47 (1969) 2703
3. see e.g. T. Chatterji, Colossal Magnetoresistance Manganites, Kluwer Academic, Dordrecht, 2004.
4. Tokura Y. Colossal Magnetoresistive Oxides, Advances in Condensed Matter Science, vol. 2 (2000), Gordon and Breach Science Publisher, London
5. Darriet P.B., Devalette M., and Latourrette B. Acta Cryst. B 34 (1978) 3528
6. Volkov N.V., Sablina K.A., Eremin E.V., Boni P., Valloppilly Sh., Flerov I.N., Kartashev A., Rasch J.C.E., Boehm M., and Schefer J. J. Phys. Condens. Matter 20 (2008) 445217
7. Marsh R.E., and Herbstein F.H. Acta Cryst. B 39 (1983) 280
8. Le Page Y., and Calvert L.D. Acta Cryst. C 40 (1984) 1787
9. J.-L. Hodeau, P. Bordet, M. Anne, A. Prat, A.N. Fitch, E. Dooryhee, G. Vaughan, A.K. Freund, in: Proceedings of the SPIE, vol. 3448, 1998, p. 353.
10. Gozzo F., Schmitt B., Bortolamedi Th., Giannini C., Guagliardi A., Lange M., Meister D., Maden D., Willmott P., and Patterson B.D. J. Alloys Compd. 362 (2004) 206
11. Gozzo F., De Caro L., Giannini C., Guagliardi A., Schmitt B., and Prodi A. J. Appl. Cryst. 39 (2007) 347
12. J. Rodriguez-Carvajal, FullProf: a program for Rietveld refinement and pattern matching analysis, Abstracts of the Satellite Meeting on Powder Diffraction of the XV Congress of the IUCr, Toulouse, France, 1990, p. 127.
13. Kamegashira N., and Umeno S. Mater. Chem. Phys. 16 (1987) 89
14. Kamegashira N., and Umeno S. Jpn. J. Appl. Phys. 25 (1986) L238
15. Brown I.D., and Altermatt D. Acta Cryst. B 41 (1985) 244