Interface effect of oxygen doping in polythiophene

Synthetic Metals

Volumn 159, Issue 12, 2009, Pages 1131-1134

  Liu, Chien Cheng ^a   Yang, Chia Ming ^a   Liu, Wen Hsing ^a   Liao, Hua Hsien ^a   Horng, Sheng Fu ^a   Meng, Hsin Fei ^b  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Glass substrate; On off ratio; Poly(3 hexylthiophene) transistor

Indexed keywords

COATED FILMS; DE-DOPING; DOPING LEVELS; ELECTRICAL CHARACTERISTIC; GATE-DIELECTRIC INTERFACES; GLASS SUBSTRATE; GLASS SUBSTRATES; HYDROXYL GROUPS; IN-VACUUM; INTERFACE EFFECT; ON-OFF RATIO; OXYGEN DOPING; OXYGEN LEVELS; POLY (3-HEXYLTHIOPHENE); POLY(3-HEXYLTHIOPHENE) TRANSISTOR; POLY-THIOPHENE; SPIN-COATED FILMS; TIME EVOLUTIONS;

CARRIER MOBILITY; GATE DIELECTRICS; GATES (TRANSISTOR); GLASS; OXIDE MINERALS; OXYGEN; QUARTZ; SUBSTRATES; SULFUR COMPOUNDS;

TRANSISTORS;

EID: 67349163218     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.synthmet.2009.01.048     Document Type: Article

References (14)

1. Sirringhaus H., Brown P.J., and Friend R.H. Nature (London) 401 (1999) 685
2. Wang G., Hirasa T., Moses D., and Heeger A.J. Synth. Met. 146 (2004) 127
3. Sirringhaus H., Tessler N., and Friend R.H. Science 280 (1998) 1741
4. Chang J.F., Sun B., and Sirringhaus H. Chem. Mater. 16 (2004) 4772
5. Meng H.F., Liu C.C., Jiang C.J., Yeh Y.L., Horng S.F., and Hsu C.S. Appl. Phys. Lett. 89 (2006) 243503
6. Halik M., Klank H., and Radlik W. Appl. Phys. Lett. 81 (2002) 289
7. Park J., Park S.Y., and Lee H.H. Appl. Phys. Lett. 85 (2004) 3284
8. Park S.K., Kim Y.H., and Kwak M.G. Synth. Met. 139 (2003) 377
9. Lu C.K., and Meng H.F. Phys. Rev. B 75 (2007) 235206
10. Mattis B., Chang P.C., and Subramanian V. Synth. Met. 156 (2006) 1241
11. Tanase C., Meijer E.J., Blom P.W.M., and de Leeuw D.M. Org. Electron. 4 (2003) 33
12. Wang G.M., Swensen J., Moses D., and Heeger A.J. J. Appl. Phys. 93 (2003) 6137
13. Veres J., Ogier S., Lloyd G., and de Leeuw D. Chem. Mater. 16 (2004) 4543
14. Grecu S., Roggenbuck M., and Opitz A. Org. Electron. 7 (2006) 276