Mass changes in NSTX surface layers with Li conditioning as measured by quartz microbalances

Journal of Nuclear Materials

Volumn 390-391, Issue 1, 2009, Pages 1005-1008

  Skinner, C H ^a   Kugel, H W ^a   Roquemore, A L ^a   Krstic, P S ^b   Beste, A ^b  

^a PRINCETON PLASMA PHYSICS LABORATORY   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITED LAYERS; DIVERTORS; GLOW DISCHARGE CONDITIONING; LITHIUM FILMS; MASS CHANGES; MEAN FREE PATHS; MECHANICAL STRESS; NATIONAL SPHERICAL TORUS EXPERIMENTS; NEUTRAL GAS; ORDER OF MAGNITUDES; QUARTZ MICROBALANCES; SURFACE LAYERS;

DEUTERIUM; DUST COLLECTORS; EVAPORATORS; GLOW DISCHARGES; HELIUM; IONIZATION OF GASES; OXIDE MINERALS; PLASMA DEPOSITION; PLASMA STABILITY; QUARTZ; QUARTZ CRYSTAL MICROBALANCES; STRESSES;

LITHIUM;

EID: 67349162202     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2009.01.263     Document Type: Article

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