Deep-UV curing of poly(4-vinyl phenol) gate dielectric for hysteresis-free organic thin-film transistors

IEEE Electron Device Letters

Volumn 30, Issue 5, 2009, Pages 454-456

  Choi, Se Jin ^a   Kim, Ju Hyun ^a   Lee, Hong H ^a  

^a Seoul National University   (South Korea)

Author keywords

Deep ultraviolet (DUV) curing; Gate dielectric; Hysteresis; Organic thin film transistor (OTFT); Patterning; Poly(4 vinyl phenol) (PVPh); UV ozone effect

Indexed keywords

DEEP-ULTRAVIOLET (DUV) CURING; ORGANIC THIN-FILM TRANSISTOR (OTFT); PATTERNING; POLY(4-VINYL PHENOL) (PVPH); UV/OZONE EFFECT;

CHEMICAL SENSORS; CURING; GATE DIELECTRICS; GATES (TRANSISTOR); HYSTERESIS; MOISTURE CONTROL; PHENOLS; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILM DEVICES; TRANSISTORS;

THIN FILM TRANSISTORS;

EID: 67349148125     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2009.2015782     Document Type: Article

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