Hierarchical test sequencing for complex systems

IEEE Transactions on Systems, Man, and Cybernetics Part A:Systems and Humans

Volumn 39, Issue 3, 2009, Pages 640-649

  Boumen, R ^a,b   Ruan, S ^c,d   de Jong, I S M ^a,b   van de Mortel Fronczak, J M ^a   Rooda, J E ^a   Pattipati, K R ^c  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b ASML   (Netherlands)

^c UNIVERSITY OF CONNECTICUT   (United States)

^d American Airlines ^*  (United States)

Author keywords

Hierarchical test sequencing; Manufacturing systems; Semiconductor manufacturing industry; Tangram; Test strategy

Indexed keywords

HIERARCHICAL TEST SEQUENCING; MANUFACTURING SYSTEMS; SEMICONDUCTOR MANUFACTURING INDUSTRY; TANGRAM; TEST STRATEGY;

DISPENSERS; HIERARCHICAL SYSTEMS; LARGE SCALE SYSTEMS; MANUFACTURE;

TESTING;

EID: 67349128306     PISSN: 10834427     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSMCA.2009.2014550     Document Type: Article

References (13)

1. ASML, 2006. [Online]. Available: http://www.asml.com
2. M. Cusumano and R. Selby, Microsoft Secrets. New York: Free Press, 1995.
3. A. Engel, I. Bogomolni, S. Shacher, and A. Grinman, "Gathering historical lifecycle quality costs to support optimizing the VVT process," in Proc. 14th Annu. Int. Symp. INCOSE, 2004, [CD-ROM].
4. Wikipedia, 2008. [Online]. Available: http://en.wikipedia.org/wiki/ Complex_system
5. C.-P. Wu, "A hybrid technique for global optimization of hierarchical systems," in Proc. IEEE Int. Conf. Syst., Man, Cybern., 1996, vol. 3, pp. 1706-1711.
6. P. P. Groumpos, "Structural analysis of multilevel hierarchical systems," in Proc. IEEE Int. Conf. Syst., Man, Cybern., 1993, vol. 4, pp. 385-389.
7. G. O'Donnell, "Using 1149.1 for multi-drop and hierarchical system testing," in Proc. WESCON, Sep. 1994, pp. 538-541.
8. R. Boumen, I. S. M. de Jong, J. W. H. Vermunt, J. M. van de Mortel-Fronczak, and J. E. Rooda, "Test sequencing in complex manufacturing systems," IEEE Trans. Syst., Man, Cybern. A, Syst., Humans, vol. 38, no. 1, pp. 25-37, Jan. 2008.
9. R. Boumen, I. S. M. de Jong, J. W. H. Vermunt, J. M. van de MortelFronczak, and J. E. Rooda, "A risk-based stopping criterion for test sequencing," Eindhoven Univ. Technol., Eindhoven, The Netherlands, Internal Rep. SE 420460, Jan. 2006.
10. K. R. Pattipati, S. Deb, R. W. Dontamsetty, and A. Maitra, "START: System testability analysis and research tool," IEEE Aerosp. Electron. Syst. Mag., vol. 6, no. 1, pp. 13-20, Jan. 1991.
11. K. R. Pattipati and M. G. Alexandridis, "Application of heuristic search and information theory to sequential diagnosis," IEEE Trans. Syst., Man, Cybern., vol. 20, no. 4, pp. 872-887, Jul./Aug. 1990.
12. M. Shakeri, V. Raghavan, K. R. Pattipati, and A. Patterson-Hine, "Sequential testing algorithms for multiple fault diagnosis," IEEE Trans. Syst., Man, Cybern. A, Syst., Humans, vol. 30, no. 1, pp. 1-14, Jan. 2000.
13. B. Vastenhouw and R. H. Bisseling, "A two-dimensional data distribution method for parallel sparse matrix-vector multiplication," SIAM Rev. vol. 47, no. 1, pp. 67-95, 2005.