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Volumn 482, Issue 1-2, 2009, Pages 429-436
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Crystal structure of single phase and low sintering temperature of α-cordierite synthesized from talc and kaolin
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Author keywords
Glass method; Rietveld refinement; Single phase cordierite
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Indexed keywords
1.8 GHZ;
COEFFICIENT OF THERMAL EXPANSION;
DIELECTRIC CONSTANTS;
FIELD EMISSION SCANNING ELECTRON MICROSCOPY;
FTIR;
FTIR ANALYSIS;
GLASS CRYSTALLIZATION;
GLASS NETWORK;
GLASS POWDER;
HEXAGONAL STRUCTURES;
ISOTHERMAL HEATING;
LATTICE PARAMETERS;
LOW SINTERING TEMPERATURE;
RIETVELD;
ROOM TEMPERATURE;
SILICATE SPECIES;
SINGLE PHASE;
SPACE GROUPS;
STRUCTURAL REFINEMENT;
X-RAY DIFFRACTION TECHNIQUES;
CERAMIC CAPACITORS;
CRYSTAL STRUCTURE;
DIELECTRIC LOSSES;
DIELECTRIC PROPERTIES;
FIELD EMISSION;
FIELD EMISSION MICROSCOPES;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
GLASS;
KAOLIN;
RIETVELD METHOD;
RIETVELD REFINEMENT;
SCANNING ELECTRON MICROSCOPY;
SILICATE MINERALS;
SILICON COMPOUNDS;
SINTERING;
TALC;
THERMAL STRESS;
THERMOANALYSIS;
THERMAL EXPANSION;
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EID: 67349105635
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2009.04.044 Document Type: Article |
Times cited : (56)
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References (54)
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