The behavior of single-molecule junctions predicted by atomistic simulations

Electrochemistry Communications

Volumn 11, Issue 5, 2009, Pages 987-989

  Olmos Asar, J A ^a   Leiva, E P M ^a   Mariscal, M M ^a  

^a DEPARTAMENTO DE FISICOQUÍMICA   (Argentina)

Author keywords

Computer simulations; Single molecule junctions; Trapping method

Indexed keywords

ATOMISTIC SIMULATIONS; ENERGY MINIMIZATIONS; MOLECULAR DYNAMIC SIMULATIONS; SINGLE-MOLECULE JUNCTIONS; SUBSTRATE SURFACES; TRAPPING METHOD;

ELECTRIC FIELDS; MOLECULAR DYNAMICS; MOLECULES;

COMPUTER SIMULATION;

EID: 67349094542     PISSN: 13882481     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elecom.2009.02.048     Document Type: Article

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