Nano-structure analysis of Fe implanted SnO2 films by 57Fe and 119Sn CEMS

Hyperfine Interactions

Volumn 191, Issue 1-3, 2009, Pages 159-165

  Nomura, Kiyoshi ^a   Reuther, Helfried ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

57Fe and 119Sn CEMS; Diluted magnetic semiconductor (DMS); Fe ion implantation; Kerr effect; SnO2 film

Indexed keywords

EID: 67349090548     PISSN: 03043843     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10751-009-9966-z     Document Type: Article

References (12)

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