SCOPUS 정보 검색 플랫폼

Applied Surface Science

Volumn 255, Issue 15, 2009, Pages 7070-7072

Junction characteristics of C 60 /polycarbonate blend on Si substrate

(5) Sharma, S S a,b Tripathi, B a Singh, M a Bhatnagar, D a Vijay, Y K a

a UNIVERSITY OF RAJASTHAN (India)

b GOVT WOMEN ENGINEERING COLLEGE (India)

Author keywords

Annealing; Ellipsometry; Fullerene; Polycarbonate; Refractive index

Indexed keywords

ANNEALING; ELECTRON TRANSPORT PROPERTIES; ELLIPSOMETRY; FULLERENES; INTERFACES (MATERIALS); PHOTOELECTROCHEMICAL CELLS; PHOTOVOLTAIC CELLS; POLYCARBONATES; REFRACTIVE INDEX; SEMICONDUCTOR JUNCTIONS;

DYNAMIC RESISTANCE; ELECTRON TRANSPORT; INTERPENETRATED NETWORKS; IV CHARACTERISTICS; OPTICAL MICROGRAPHS; POLYCARBONATE BLENDS; POLYCARBONATE MATRICES; SPHERICAL MOLECULES;

SUBSTRATES;

EID: 67349090059 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2009.03.060 Document Type: Article

Times cited : (5)

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