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Journal of Applied Physics

Volumn 105, Issue 9, 2009, Pages

Polarization retention on short, intermediate, and long time scales in ferroelectric thin films

(1) Lou, X J a

a NATIONAL UNIVERSITY OF SINGAPORE (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ADJUSTABLE PARAMETERS; EXPERIMENTAL OBSERVATION; FERROELECTRIC THIN-FILM CAPACITORS; HIGHER TEMPERATURES; POWER-LAW FUNCTIONS; RETENTION LOSS; SHORT TIME SCALE; STRETCHED EXPONENTIAL; TIME-SCALE;

FERROELECTRIC THIN FILMS; FERROELECTRICITY; THIN FILM CIRCUITS;

FERROELECTRIC FILMS;

EID: 67249151016 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3106663 Document Type: Article

Times cited : (37)

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