Isoconversional kinetic analysis of the crystallization phases of amorphous selenium thin films

Thin Solid Films

Volumn 517, Issue 21, 2009, Pages 6137-6141

  Joraid, A A ^a   Abu Sehly, A A ^a   Alamri, S N ^a  

^a TAIBAH UNIVERSITY   (Saudi Arabia)

Author keywords

Annealing effect; Crystallization kinetics; DSC; Model free; Selenium; Thermal analysis

Indexed keywords

AMORPHOUS SELENIUM; ANNEALING EFFECT; CRYSTAL PHASIS; CRYSTALLIZATION ACTIVATION ENERGY; CRYSTALLIZATION CURVES; CRYSTALLIZATION PHASIS; DSC; EXOTHERMIC CRYSTALLIZATION; ISO-CONVERSIONAL METHOD; ISOCONVERSIONAL KINETIC ANALYSIS; KISSINGER; MODEL-FREE; MONOCLINIC PHASIS; MULTI-STEP; NON-ISOTHERMAL CONDITION; THERMAL ANALYSIS; THERMAL TREATMENT;

ACTIVATION ENERGY; AMORPHOUS FILMS; ANNEALING; ATOMIC FORCE MICROSCOPY; DIFFERENTIAL SCANNING CALORIMETRY; LIGHT MEASUREMENT; SCANNING; SCANNING ELECTRON MICROSCOPY; SELENIUM; SEMICONDUCTING SELENIUM COMPOUNDS; THERMOANALYSIS; THIN FILMS;

CRYSTALLIZATION KINETICS;

EID: 67249136111     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.05.034     Document Type: Article

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