Application of the operating window concept to improve fuser reliability: A case study on failure modes of hot and cold offset

International Conference on Digital Printing Technologies

Volumn , Issue , 2008, Pages 526-531

  Esterman Jr , Marcos ^a   Dargan, Sourabh ^a   Arney, J S ^a   Brian, K ^a  

^a ROCHESTER INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROPHOTOGRAPHY; FUSING-PROCESS; IDEAL FUNCTION; NOISE PARAMETERS; OPERATING WINDOWS; ROBUST DESIGNS;

DESIGN; PHOTOGRAPHY; QUALITY ASSURANCE; WINDOWS;

FAILURE ANALYSIS;

EID: 67249135001     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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