Microsystem 671nm light source for shifted excitation Raman difference spectroscopy

Applied Optics

Volumn 48, Issue 15, 2009, Pages 2789-2792

  Maiwald, Martin ^a   Schmidt, Heinar ^b   Sumpf, Bernd ^a   Erbert, Götz ^a   Kronfeldt, Heinz Detlef ^b   Tränkle, Günther ^a  

^a LEIBNIZ INSTITUT FÜR HÖCHSTFREQUENZTECHNIK   (Germany)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT SOURCES;

CENTER WAVELENGTH; CRESYL VIOLET; LASER SYSTEMS; MICRO-OPTICAL BENCH; OUTPUT POWER; SHIFTED EXCITATION RAMAN DIFFERENCE SPECTROSCOPIES; SPECTRAL WIDTHS; WAVELENGTH SHIFT;

LASER EXCITATION;

ARTICLE; DIODE LASER; INSTRUMENTATION; LIGHT RELATED PHENOMENA; METHODOLOGY; OPTICAL INSTRUMENTATION; RAMAN SPECTROMETRY;

LASERS, SEMICONDUCTOR; OPTICAL DEVICES; OPTICAL PHENOMENA; SPECTRUM ANALYSIS, RAMAN;

EID: 67249127020     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.48.002789     Document Type: Article

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