Raman Analysis of Yield in Cortical Bone

Progress in Biomedical Optics and Imaging - Proceedings of SPIE

Volumn 7166, Issue , 2009, Pages

  Jeon, Ji Hoon ^a   Korlepara, Vinay J ^b   Blendell, John ^c   Akkus, Ozan ^a  

^a PURDUE UNIVERSITY   (United States)

^b MAKO Surgical Corporation   (United States)

^c Purdue University   (United States)

Author keywords

Bone Tissue; Digital Image Correlation; Raman Spectroscopy

Indexed keywords

BONE TISSUE; CORTICAL BONE; DIGITAL IMAGE CORRELATION; DIGITAL IMAGE CORRELATIONS; FAILURE PROCESS; LOCAL STRAINS; MESO SCALE; MICRON SCALE; MULTIPLE ORDERS; NEGATIVE SHIFT; RAMAN ANALYSIS; RAMAN MICROSPECTROSCOPY; STRESS PATTERNS; STRUCTURAL HIERARCHIES; SUPRAMOLECULAR LEVEL; TENSILE DEFORMATION; TENSILE RESIDUALS; WAVE NUMBERS;

DEFORMATION; DIGITAL IMAGE STORAGE; MINING; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SINGLE CRYSTALS; SPECTRUM ANALYSIS; STRAIN MEASUREMENT; SUPRAMOLECULAR CHEMISTRY; TENSILE STRAIN;

BONE;

EID: 67249114743     PISSN: 16057422     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.810020     Document Type: Conference Paper

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