On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors

Proceedings - International Test Conference

Volumn , Issue , 2008, Pages

  Karimiy, Naghmeh ^a   Maniatakos, Michail ^b   Jas, Abhijit ^c   Makris, Yiorgos ^b  

^a UNIVERSITY OF TEHRAN   (Iran)

^b YALE UNIVERSITY   (United States)

^c INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL LOGIC; DIAGNOSABILITY; ERROR TYPES; FURTHER DEVELOPMENT; IN-CONTROL; INSTRUCTION-LEVEL; MANUFACTURABILITY; MODERN MICROPROCESSOR; OUT OF ORDER; REGISTER TRANSFER LEVEL; ROBUST DESIGNS; STUCK-AT FAULTS; SUPERSCALAR; TEST VEHICLE; TESTABILITY; TRANSIENT ERRORS;

EMBEDDED SYSTEMS; ERRORS; LOGIC DEVICES;

MICROPROCESSOR CHIPS;

EID: 67249109021     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2008.4700613     Document Type: Conference Paper

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